Publications

Found 5 results
Filters: Author is Jen-Yi Wuu  [Clear All Filters]
2011
J. - Y. Wuu, F. G. Pikus, M. Marek-Sadowska, and M. L. Rieger, “Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching”, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.
J. - Y. Wuu, F. G. Pikus, and M. Marek-Sadowska, “Metrics for characterizing machine learning-based hotspot detection methods”, in Quality Electronic Design (ISQED), 2011 12th International Symposium on, 2011, p. 1 -6.
J. - Y. Wuu, F. G. Pikus, A. Torres, and M. Marek-Sadowska, “Rapid layout pattern classification”, in Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific, 2011, p. 781 -786.
2009
J. - Y. Wuu, F. G. Pikus, A. Torres, M. Marek-Sadowska, V. K. Singh, and M. L. Rieger, “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
2008
J. - Y. Wuu, F. G. Pikus, and M. Marek-Sadowska, “Fast and simple modeling of non-rectangular transistors”, in Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, 2008, vol. 7122.