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- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
- On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
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Starbist Scan Autocorrelated Random Pattern Generation
| Title | Starbist Scan Autocorrelated Random Pattern Generation |
| Publication Type | Conference Paper |
| Year of Publication | 1997 |
| Authors | Tsai, K-H, Hellebrand, S, Rajski, J, Marek-Sadowska, M |
| Conference Name | Design Automation Conference, 1997. Proceedings of the 34th |
| Date Published | jun |
| Abstract | Not available |
| DOI | 10.1109/DAC.1997.597194 |
