- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
- Vertical Slit Field Effect Transistor in ultra-low power applications
- Can pin access limit the footprint scaling?
- A Low Energy Network-on-Chip Fabric for 3-D Multi-Core Architectures
- Performance Optimization Using Variable-Latency Design Style
- Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration
- Low power, high throughput network-on-chip fabric for 3D multicore processors
Starbist Scan Autocorrelated Random Pattern Generation
| Title | Starbist Scan Autocorrelated Random Pattern Generation |
| Publication Type | Conference Paper |
| Year of Publication | 1997 |
| Authors | Tsai, K-H, Hellebrand, S, Rajski, J, Marek-Sadowska, M |
| Conference Name | Design Automation Conference, 1997. Proceedings of the 34th |
| Date Published | jun |
| Abstract | Not available |
| DOI | 10.1109/DAC.1997.597194 |
