Publications

Found 14 results
Filters: Author is Janusz Rajski  [Clear All Filters]
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V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
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K. - H. Tsai, Hellebrand, S., Rajski, J., and Marek-Sadowska, M., Starbist Scan Autocorrelated Random Pattern Generation, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 472 -477.
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., STAR-ATPG: a high speed test pattern generator for large scan designs, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Star test: the theory and its applications, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Multiple fault diagnosis using n-detection tests, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
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V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Improving the Resolution of Single-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Diagnosis of hold time defects, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay-fault diagnosis using timing information, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis using timing information, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis for nonrobust test, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Analysis and methodology for multiple-fault diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.