Publications
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Filters: Keyword is test point insertion and Author is Chih-Chang Lin [Clear All Filters]
“Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
, “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
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