Publications
Found 3 results
Filters: Keyword is test point insertion and Author is Kwang-Ting Cheng [Clear All Filters]
“Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
, “Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
, “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
,