Publications

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Conference Paper
F. Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Wang, Y., Kinser, E., Kumar, M., Wang, Y., Kane, T., Feng, K. D., Henson, W. K., Mocuta, D., and Li, Di-an, “Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
J. - Y. Wuu, Pikus, F. G., Torres, A., and Marek-Sadowska, M., “Rapid layout pattern classification”, in Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific, 2011, pp. 781 -786.