Publications

Found 5 results
Filters: Keyword is electromigration  [Clear All Filters]
Journal Article
A. Todri and Marek-Sadowska, M., “Reliability Analysis and Optimization of Power-Gated ICs”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, pp. 457 -468, 2011.
Conference Paper
A. Todri and Marek-Sadowska, M., “A study of reliability issues in clock distribution networks”, in Computer Design, 2008. ICCD 2008. IEEE International Conference on, 2008, pp. 101 -106.
C. - W. Chang, Wang, K., and Marek-Sadowska, M., “Layout-driven hot-carrier degradation minimization using logic restructuring techniques”, in Design Automation Conference, 2001. Proceedings, 2001, pp. 97 - 102.
A. Todri, Chang, S. - C., and Marek-Sadowska, M., “Electromigration and voltage drop aware power grid optimization for power gated ICs”, in Low Power Electronics and Design (ISLPED), 2007 ACM/IEEE International Symposium on, 2007, pp. 391 -394.
A. Todri, Marek-Sadowska, M., and Chang, S. - C., “Analysis and optimization of power-gated ICs with multiple power gating configurations”, in Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on, 2007, pp. 783 -790.