Publications
Found 4 results
Filters: Keyword is integrated circuit reliability and Author is Kai Wang [Clear All Filters]
“Layout-driven hot-carrier degradation minimization using logic restructuring techniques”, in Design Automation Conference, 2001. Proceedings, 2001, pp. 97 - 102.
, “On-chip power supply network optimization using multigrid-based technique”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 113 - 118.
, “Power/ground mesh area optimization using multigrid-based technique [IC design]”, in Design, Automation and Test in Europe Conference and Exhibition, 2003, 2003, pp. 850 - 855.
, “Fast postplacement optimization using functional symmetries”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 23, pp. 102 - 118, 2004.
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