Publications
Found 2 results
Filters: Keyword is integrated circuit reliability and Author is Chih-Wei Chang [Clear All Filters]
, “Layout-driven hot-carrier degradation minimization using logic restructuring techniques”, in Design Automation Conference, 2001. Proceedings, 2001, pp. 97 - 102.
, “Fast postplacement optimization using functional symmetries”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 23, pp. 102 - 118, 2004.
