Publications

Found 11 results
Filters: Keyword is automatic test pattern generation  [Clear All Filters]
Conference Paper
C. - W. Chang and Marek-Sadowska, M., “ATPG-based logic synthesis: an overview”, in Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on, 2002, pp. 786 - 789.
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., “Fast Boolean optimization by rewiring”, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.
S. - C. Chang and Marek-Sadowska, M., “Perturb and simplify: optimizing circuits with external don't cares”, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., “STAR-ATPG: a high speed test pattern generator for large scan designs”, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing-Aware Multiple-Delay-Fault Diagnosis”, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
Journal Article
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., “Circuit optimization by rewiring”, Computers, IEEE Transactions on, vol. 48, pp. 962 -970, 1999.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
C. - C. Lin, Chen, K. - C., and Marek-Sadowska, M., “Logic synthesis for engineering change”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 18, pp. 282 -292, 1999.
S. - C. Chang, Marek-Sadowska, M., and Cheng, K. - T., “Perturb and simplify: multilevel Boolean network optimizer”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 15, pp. 1494 -1504, 1996.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing-Aware Multiple-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.