Publications

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Filters: Keyword is timing-aware automatic test pattern generation sets  [Clear All Filters]
2008
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.