Publications

Found 1 results
Filters: Keyword is 180 nm  [Clear All Filters]
2006
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology”, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.