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V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.