Publications

Found 6 results
Filters: Keyword is logic testing and Author is Tien-Chien Lee  [Clear All Filters]
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C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., Cost-free scan: a low-overhead scan path design, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
C. - C. Lin, Lee, T. - C., Marek-Sadowska, M., and Chen, K. - C., Cost-free scan: a low-overhead scan path design methodology, in Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on, 1995, pp. 528 -533.
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D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
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C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Scan paths through functional logic, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
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C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test point insertion: scan paths through combinational logic, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test-point insertion: scan paths through functional logic, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.