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Filters: Keyword is logic testing and Author is Chang, D.  [Clear All Filters]
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D. Chang and Marek-Sadowska, M., Partitioning sequential circuits on dynamically reconfigurable FPGAs, Computers, IEEE Transactions on, vol. 48, pp. 565 -578, 1999.
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.