Publications
Found 2 results
Filters: Keyword is logic testing and Author is Chang, D. [Clear All Filters]
“Partitioning sequential circuits on dynamically reconfigurable FPGAs”, Computers, IEEE Transactions on, vol. 48, pp. 565 -578, 1999.
, “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
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