Publications

Found 5 results
Filters: Keyword is integrated circuit testing and Author is Kun-Han Tsai  [Clear All Filters]
2008
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
2006
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis for nonrobust test, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Star test: the theory and its applications, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.