Publications

Found 3 results
Filters: Keyword is flip-flops and Author is Kwang-Ting Cheng  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
F
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
S
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Scan paths through functional logic, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
T
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test-point insertion: scan paths through functional logic, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.