Publications
Found 2 results
Filters: Keyword is automatic testing and Author is Tien-Chien Lee [Clear All Filters]
, “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
, “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
