Publications

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Filters: Keyword is automatic testing and Author is Janusz Rajski  [Clear All Filters]
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K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.