Publications

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Filters: Keyword is long-term reliability and Author is Chih-Wei Chang  [Clear All Filters]
2001
C. - W. Chang, Wang, K., and Marek-Sadowska, M., “Layout-driven hot-carrier degradation minimization using logic restructuring techniques”, in Design Automation Conference, 2001. Proceedings, 2001, pp. 97 - 102.