Publications

Found 2 results
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2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
1998
C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., “Cost-free scan: a low-overhead scan path design”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.