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Filters: Keyword is design for testability and Author is Kuang-Chien Chen  [Clear All Filters]
C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., Cost-free scan: a low-overhead scan path design, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.