Publications
Found 3 results
Filters: Keyword is design for testability and Author is Kwang-Ting Cheng [Clear All Filters]
“Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
, “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
, “Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
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