Publications
Found 8 results
Filters: Author is Tien-Chien Lee [Clear All Filters]
“Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
, “A Test Synthesis Approach To Reducing Ballast Dft Overhead”, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 466 -471.
, “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
, “Sequential permissible functions and their application to circuit optimization”, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 334 -339.
, “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
, “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
, “Cost-free scan: a low-overhead scan path design methodology”, in Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on, 1995, pp. 528 -533.
, “Cost-free scan: a low-overhead scan path design”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
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