Publications

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V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
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V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Improving the Resolution of Single-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
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V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis for nonrobust test, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.