Publications

Found 28 results
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Analysis and methodology for multiple-fault diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
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Y. Ran and Marek-Sadowska, M., Crosstalk noise in FPGAs, in Design Automation Conference, 2003. Proceedings, 2003, pp. 944 - 949.
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V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis for nonrobust test, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis using timing information, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay-fault diagnosis using timing information, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
Y. Ran and Marek-Sadowska, M., Designing a via-configurable regular fabric, in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, 2004, pp. 423 - 426.
Y. Ran and Marek-Sadowska, M., On designing via-configurable cell blocks for regular fabrics, in Design Automation Conference, 2004. Proceedings. 41st, 2004, pp. 198 -203.
Y. Ran and Marek-Sadowska, M., Designing via-configurable logic blocks for regular fabric, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 14, pp. 1 -14, 2006.
J. - Y. Wuu, Pikus, F. G., Torres, A., Marek-Sadowska, M., Singh, V. K., and Rieger, M. L., Detecting context sensitive hot spots in standard cell libraries, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Diagnosis of hold time defects, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
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J. - Y. Wuu, Pikus, F. G., Marek-Sadowska, M., and Rieger, M. L., Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.
Y. Ran, Kondratyev, A., Tseng, K., Watanabe, Y., and Marek-Sadowska, M., Eliminating false positives in crosstalk noise analysis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1406 - 1419, 2005.
Y. Ran, Kondratyev, A., Watanabe, Y., and Marek-Sadowska, M., Eliminating false positives in crosstalk noise analysis, in Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings, 2004, vol. 2, pp. 1192 - 1197 Vol.2.
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K. Wang, Ran, Y., Jiang, H., and Marek-Sadowska, M., General skew constrained clock network sizing based on sequential linear programming, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 773 - 782, 2005.
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V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Improving the Resolution of Single-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
Y. Ran and Marek-Sadowska, M., An integrated design flow for a via-configurable gate array, in Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on, 2004, pp. 582 - 589.
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Y. Ran and Marek-Sadowska, M., The magic of a via-configurable regular fabric, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 338 - 343.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Multiple fault diagnosis using n-detection tests, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
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K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Star test: the theory and its applications, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., STAR-ATPG: a high speed test pattern generator for large scan designs, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
K. - H. Tsai, Hellebrand, S., Rajski, J., and Marek-Sadowska, M., Starbist Scan Autocorrelated Random Pattern Generation, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 472 -477.
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D. Chai, Kondratyev, A., Ran, Y., Tseng, K., Watanabe, Y., and Marek-Sadowska, M., Temporofunctional crosstalk noise analysis, in Design Automation Conference, 2003. Proceedings, 2003, pp. 860 - 863.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Timing-Aware Multiple-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.

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