Publications
, “Crosstalk noise in FPGAs”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 944 - 949.
, “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
, “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
, “Designing a via-configurable regular fabric”, in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, 2004, pp. 423 - 426.
, “On designing via-configurable cell blocks for regular fabrics”, in Design Automation Conference, 2004. Proceedings. 41st, 2004, pp. 198 -203.
, “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
, “Diagnosis of hold time defects”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
, “Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching”, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.
, “Eliminating false positives in crosstalk noise analysis”, in Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings, 2004, vol. 2, pp. 1192 - 1197 Vol.2.
, “An integrated design flow for a via-configurable gate array”, in Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on, 2004, pp. 582 - 589.
, “The magic of a via-configurable regular fabric”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 338 - 343.
, “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
, “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
, “STAR-ATPG: a high speed test pattern generator for large scan designs”, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
, “Starbist Scan Autocorrelated Random Pattern Generation”, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 472 -477.
, “Temporofunctional crosstalk noise analysis”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 860 - 863.
, “Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology”, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
, “Timing-Aware Multiple-Delay-Fault Diagnosis”, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
, “Via-configurable routing architectures and fast design mappability estimation for regular fabrics”, in Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on, 2005, pp. 25 - 32.
, “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
, “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
, “Designing via-configurable logic blocks for regular fabric”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 14, pp. 1 -14, 2006.
, “Eliminating false positives in crosstalk noise analysis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1406 - 1419, 2005.
, “General skew constrained clock network sizing based on sequential linear programming”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 773 - 782, 2005.
, “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
