Publications

Found 4 results
Filters: Author is Shih-Chieh Chang and Keyword is automatic test pattern generation  [Clear All Filters]
1999
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., “Circuit optimization by rewiring”, Computers, IEEE Transactions on, vol. 48, pp. 962 -970, 1999.
1996
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., “Fast Boolean optimization by rewiring”, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.
S. - C. Chang, Marek-Sadowska, M., and Cheng, K. - T., “Perturb and simplify: multilevel Boolean network optimizer”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 15, pp. 1494 -1504, 1996.
S. - C. Chang and Marek-Sadowska, M., “Perturb and simplify: optimizing circuits with external don't cares”, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.