Perturb and simplify: optimizing circuits with external don't cares

TitlePerturb and simplify: optimizing circuits with external don't cares
Publication TypeConference Paper
Year of Publication1996
AuthorsChang, S-C, Marek-Sadowska, M
Conference NameEuropean Design and Test Conference, 1996. ED TC 96. Proceedings
Date Publishedmar
KeywordsATPG guided logic optimization, automatic test pattern generation, automatic testing, circuit optimisation, circuit optimization, external don't cares, ISCAS, logic testing, MCNC, perturbation techniques, perturbation theory
AbstractEarlier optimization techniques based on Automatic Test Pattern Generation could not handle external don't cares. We propose a technique that uses external don't cares during the ATPG guided logic optimization. This technique transforms external don't cares into internal don't cares. Thus, the optimization can utilize the external don't cares to obtain better results. Additionally, we also discuss some perturbation techniques to improve further results of logic optimizers. Based on a careful analysis of don't cares migration during incremental changes of an optimized circuit, we have developed a strategy to guide optimization. We have performed experiments on MCNC and ISCAS benchmarks and the results are very encouraging