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- Can pin access limit the footprint scaling?
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- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
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Can pin access limit the footprint scaling?
| Title | Can pin access limit the footprint scaling? |
| Publication Type | Conference Paper |
| Year of Publication | 2012 |
| Authors | Qiu, X, Marek-Sadowska, M |
| Conference Name | Proceedings of the 49th Annual Design Automation Conference |
| Publisher | ACM |
| Conference Location | New York, NY, USA |
| ISBN Number | 978-1-4503-1199-1 |
| Keywords | detailed routing, net partitioning, pin density, two-sided routing, VeSFET |
| URL | http://doi.acm.org/10.1145/2228360.2228560 |
| DOI | 10.1145/2228360.2228560 |
