Publications

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Filters: Author is Kun-Han Tsai and Keyword is scan encoded test pattern generation  [Clear All Filters]
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.