Publications

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Filters: Author is Kun-Han Tsai and Keyword is n-detection test  [Clear All Filters]
2003
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.