Multiple fault diagnosis using n-detection tests

TitleMultiple fault diagnosis using n-detection tests
Publication TypeConference Paper
Year of Publication2003
AuthorsWang, Z, Marek-Sadowska, M, Tsai, K-H, Rajski, J
Conference NameComputer Design, 2003. Proceedings. 21st International Conference on
Date Publishedoct.
Keywordsautomatic testing, fault diagnosis, multiple fault diagnosis, n-detection test
AbstractWe study the relationship between multiple fault diagnosability and fault detection count. Instead of developing a complex diagnostic algorithm for multiple fault behavior, we change the test sets used in test and diagnosis. This allows us to apply a simple single-fault based diagnostic algorithm, and yet achieve very good diagnosability for the failure test cases caused by multiple faults. We have verified experimentally the effectiveness of n-detection tests for multiple-fault cases and explained the results in probabilistic terms.