Publications

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Filters: Author is Chih-Chang Lin and Keyword is automatic testing  [Clear All Filters]
1996
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.