Publications

Found 2 results
Filters: Author is Kuang-Chien Chen and Keyword is logic testing  [Clear All Filters]
1998
C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., “Cost-free scan: a low-overhead scan path design”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
1995
C. - C. Lin, Lee, T. - C., Marek-Sadowska, M., and Chen, K. - C., “Cost-free scan: a low-overhead scan path design methodology”, in Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on, 1995, pp. 528 -533.