Publications

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Filters: Keyword is diagnostic test patterns  [Clear All Filters]
2006
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.