Publications

Found 3 results
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2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
1998
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
1996
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.