Found 2 results
Filters: Keyword is design for manufacture  [Clear All Filters]
J. - Y. Wuu, Pikus, F. G., and Marek-Sadowska, M., Metrics for characterizing machine learning-based hotspot detection methods, in Quality Electronic Design (ISQED), 2011 12th International Symposium on, 2011, pp. 1 -6.
W. Maly, Yi-Wei Lin, and Marek-Sadowska, M., OPC-Free and Minimally Irregular IC Design Style, in Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE, 2007, pp. 954 -957.