Publications
“Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
, “On-chip em-sensitive interconnect structures”, in SLIP '10: Proceedings of the 12th ACM/IEEE international workshop on System level interconnect prediction, 2010, pp. 43–50.
, “Variation-aware electromigration analysis of power/ground networks”, in Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on, 2011, pp. 571 -576.
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