Publications
Found 2 results
Filters: Author is Tien-Chien Lee and Keyword is integrated circuit testing [Clear All Filters]
, “Cost-free scan: a low-overhead scan path design”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
, “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
