Publications

Found 4 results
Filters: Keyword is functional logic  [Clear All Filters]
1998
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
1996
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.