Publications

Found 2 results
Filters: Keyword is boundary scan testing  [Clear All Filters]
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
1996
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.