Publications

Found 2 results
Filters: Author is Michael L. Rieger  [Clear All Filters]
2009
J. - Y. Wuu, Pikus, F. G., Torres, A., Marek-Sadowska, M., Singh, V. K., and Rieger, M. L., “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
2011
J. - Y. Wuu, Pikus, F. G., Marek-Sadowska, M., and Rieger, M. L., “Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching”, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.