Found 2 results
Filters: Keyword is integrated circuit reliability and Author is Chih-Wei Chang  [Clear All Filters]
C. - W. Chang, Hsiao, M. - F., Hu, B., Wang, K., Marek-Sadowska, M., Cheng, C. - K., and Chen, S. - J., Fast postplacement optimization using functional symmetries, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 23, pp. 102 - 118, 2004.