Found 2 results
Filters: Keyword is automatic testing and Author is Janusz Rajski  [Clear All Filters]
Conference Paper
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Multiple fault diagnosis using n-detection tests, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.