Publications

Found 3 results
Filters: Author is Kun-Han Tsai and Keyword is manufacturing defects  [Clear All Filters]
2008
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
2006
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology”, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.