| Title | Delay fault diagnosis for nonrobust test |
| Publication Type | Conference Paper |
| Year of Publication | 2006 |
| Authors | Mehta, V, Wang, Z, Marek-Sadowska, M, Tsai, K-H, Rajski, J |
| Conference Name | Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on |
| Date Published | march |
| Keywords | delay fault diagnosis, delays, design timing failures, failure analyzer, fault diagnosis, integrated circuit reliability, integrated circuit testing, manufacturing defects, nonrobust propagation conditions, nonrobust test, parameter variations |
| Abstract | With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer's behavior. We propose a novel approach to perform delay-fault diagnosis for robust and nonrobust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience |
| DOI | 10.1109/ISQED.2006.45 |
