Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology

TitleTiming Defect Diagnosis in Presence of Crosstalk for Nanometer Technology
Publication TypeConference Paper
Year of Publication2006
AuthorsMehta, V, Marek-Sadowska, M, Tsai, K-H, Rajski, J
Conference NameTest Conference, 2006. ITC '06. IEEE International
Date PublishedOct.
Keywords130 nm, 180 nm, 65 nm, 90 nm, crosstalk, crosstalk coupling, delay-defect diagnosis, integrated circuit testing, manufacturing defects, nanometer technology, nanotechnology, SDF delay information, timing defect diagnosis, timing failures, timing jitter
AbstractWith feature sizes shrinking, manufacturing defects and parameter variations often cause design timing failures. Crosstalk coupling is one of such causes. It is essential that timing failures be correctly and quickly diagnosed. The authors present a methodology to diagnose the delay-defect in presence of crosstalk, given the physical information such as crosstalk coupling capacitance, neighborhood information and SDF delay information. The authors provide diagnosis results for 180, 130, 90 and 65 nm technologies
DOI10.1109/TEST.2006.297626