Publications

Found 4 results
Filters: Author is Kun-Han Tsai and First Letter Of Title is S  [Clear All Filters]
2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
1999
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., “STAR-ATPG: a high speed test pattern generator for large scan designs”, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
K. - H. Tsai, Hellebrand, S., Rajski, J., and Marek-Sadowska, M., “Starbist Scan Autocorrelated Random Pattern Generation”, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 472 -477.