Publications

Found 4 results
Filters: First Letter Of Title is D and Author is Janusz Rajski  [Clear All Filters]
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D
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis for nonrobust test, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis using timing information, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay-fault diagnosis using timing information, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Diagnosis of hold time defects, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.